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Characterisation

Characterisation methods are available for a broad range of materials and structures and allow for electro-optical characterisation of particles or surfaces, microscopic methods enable the imaging of particles and demonstration of the atomic arrangement within particles. Metrological services are available for systems containing silica, polymers, metals, ceramics or glass.

  • Characterisation
  • Characterisation
  • Characterisation
  • Characterisation
  • Characterisation
  • Characterisation
  • Characterisation

Installation

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Partner

Auger Electron Spectroscopy KIT *)
Electro-optical Characterization CRF
HRTEM TITAN CEA
Micrometrology
 (METRO LAB)
Tekniker
Metrology NPL
NANO Beam Line (expected 2011) KIT *)
TEM KIT *)
XPEEM CEA
X-Ray Tomography   CEA  

New in 4th Call!

 

*) new phone numbers in 2011

 
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EUMINAfab User Office
Thomas Schaller
Phone +49(721)608-23123
Fax +49(721)608-26273
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