English
Characterisation
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Characterisation methods are available for a broad range of materials and structures and allow for electro-optical characterisation of particles or surfaces, microscopic methods enable the imaging of particles and demonstration of the atomic arrangement within particles. Metrological services are available for systems containing silica, polymers, metals, ceramics or glass. |
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Installation(Click to open/download PDF file) |
Partner |
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| Auger Electron Spectroscopy | KIT | *) | ||
| Electro-optical Characterization | CRF | |||
| HRTEM TITAN | CEA | |||
| Micrometrology (METRO LAB) |
Tekniker | |||
| Metrology | NPL | |||
| NANO Beam Line (expected 2011) | KIT | *) | ||
| TEM | KIT | *) | ||
| XPEEM | CEA | |||
| X-Ray Tomography | CEA |
New in 4th Call! |
*) new phone numbers in 2011



